Materials characterisation & surface analysis specialising in ion beam analysis including SIMS, uleSIMS, RBS, Auger, XPS, RBS, FIB/TEM and surface contamination (TOF-SIMS, VPD-TXRF, VPD-ICPMS). Semiconductors, photovoltaics, optical coatings.

sims analysis tem analysis tof-sims auger rutherford Aystorm Scientific Ltd. Scientific Sale Cheshire
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